筑波大学 · 数理物質系

研究キーワードscanning electron microscopy・electron detectors・cathodoluminescence・nitrogen vacancy centers・GaN defects・electron beam induced current・low vacuum SEM・microchannel plate detector・semiconductor characterization

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• Detection of negative charge state luminescence from nitrogen vacancy centers under electron beam excitation: effects of extrinsic and intrinsic factors2026 · 論文
• Detection of low-energy backscattered electron in scanning electron microscopy using microchannel plate detector2025 · 論文
• Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM2025 · 論文
• Characterization of ultra-variable-pressure detector for secondary electrons in low-vacuum SEM2025 · 論文

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