名古屋大学 · 未来材料・システム研究所

研究关键词InGaN photocathodes・negative electron affinity・photoelectron beams・scanning electron microscopy・electron emission・electric propulsion・pulsed electron beams・beam current control

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• Photoelectron beam technology for SEM imaging with pixel-specific control of irradiation beam current2023 · METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII 12496 巻 2023年
• Novel Electron Beam Technology using InGaN Photocathode for High-Throughput Scanning Electron Microscope Imaging2023 · METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII 12496 巻 2023年
• Investigation on Applying an InGaN Photocathode with Negative Electron Affinity for Electric Propulsion2023 · TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES 66 巻 ( 1 ) 頁： 10 - 13 2023年
• Time response measurement of pulsed electron beam from InGaN photocathode2022 · 40 巻 頁： 064204 2022年11月

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