Fukuoka University of Education · Graduate School of Education / Faculty of Education · 講師

Research keywordsTiO2(011) reconstruction・atomic force microscopy・scanning tunneling microscopy・silicon flash annealing・electron beam charging・LEED instrumentation・probe tip characterization・multi-probe STM

This is a public-data preview. Personalized fit, contact angles, and saved workflows require sign-in.

• Field-assisted oxygen etching for sharp field-emission tip
• Consistent probe spacing in multi-probe STM experiments
• Identification of Si and Ge atoms by atomic force microscopy
• Subsurface Charge Repulsion of Adsorbed H-Adatoms on TiO2(110)

• 薄膜、表面界面物性, ナノ構造物理 （キーワード：走査プローブ顕微鏡、走査トンネル顕微鏡、原子間力顕微鏡、半導体、二次元物質）最近の研究課題・キーワード
• 原子間力顕微鏡による単原子の力学的な元素識別
• 原子間力顕微鏡による二次元ハニカム格子状の単層SiGeの探索

• Official profile
• ORCID