Kanagawa University · Faculty of Engineering / Graduate School of Engineering · 助教

Research keywordsJosephson junctions・SQUID microscopy・superconducting thin films・magnetic field measurement・scanning probe microscopy・niobium junctions

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• 電界放射顕微鏡および走査プローブ顕微鏡による電子源の評価
• Perpendicular applied magnetic field dependence of Josephson current and measurement of trapped magnetic flux in Nb superconducting thin film by vibrating sample magnetometer
• 大バルクハウゼン効果を用いた薄膜磁気センサの作製
• Scanning SQUID probe microscope with STM and AFM

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