Keio University · Faculty of Science and Engineering / Graduate School of Science and Engineering

Research keywordsMOSFET reliability・energy harvesting systems・4H-silicon carbide diodes・integrated photovoltaics・SiGe transistors・electrothermal simulation・thermoelectric devices・standard CMOS processes

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• Silicon-Germanium Ultrashort-Gate Transistor Performances by Electrical-Thermal Simulations2024 · IEEE Transactions on Nanotechnology 23
• Mechanical Stress Effects on 4H-Silicon Carbide Power Diodes2024 · IEEE Open Journal of Power Electronics 5
• Bulk Carrier Contaminations and Their Effects on MOSFETs Under Energy Harvesting Systems2024 · IEEE Journal of the Electron Devices Society 12
• Photovoltaic-Generated Millivolt Reference Using Multiple Integrated Photovoltaic Cells2024 · IEEE Electron Device Letters 45

• 人工シナプス用多チャンネル膜電位固定LSIの実現2014 · -

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