Nagoya Institute of Technology · Department of Social Engineering · 助教

Research keywordsstatistical process control・automatic process control・orthogonal arrays・response surface methods・semiconductor manufacturing・quality engineering

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• Visualization for Confounding of Interactions in Mixed-level Orthogonal Arrays and Its Application to Response Surface2018 · Journal of Japan Industrial Management Association. 68 , 4 , p. 244-250 7 p. 研究成果 : ジャーナルへの寄稿 › 記事 › 査読 Confounding 100% Response Surface 100% Orthogonal Array 100% Design Experiment 25% Interaction Effect 25%
• On the integration of SPC and APC: APC can be a convenient support for SPC2012
• Statistical process control for semiconductor manufacturing processes2010
• Structural analysis of steering wheel grip comfort by the semantic differential method2006 · Proceedings of the Institution of Mechanical Engineers. Part I: Journal of Systems and Control Engineering. 220 , 8 , p. 675-681 7 p. 研究成果 : ジャーナルへの寄稿 › 記事 › 査読 Semantic Differential 100% Structural Model 75% Component Analysis 33% Principal Component 33% 3 リンクは新しいタブで開きます 被引用数 (Scopus)

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