Tohoku University · Institute of Multidisciplinary Research for Advanced Materials

Research keywordsoxide heterointerfaces・common anion rule・angle-resolved photoemission spectroscopy・VO2 thin films・anatase TiO2 surfaces・correlated oxide electronics・CuSe2 surface states・Cr-doped VO2

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• Dirac-like band dispersion at the pyrite-type CuSe2 (100) surface revealed by soft x-ray angle-resolved photoemission spectroscopyK. Fujinuma, D. Takegami, H. Honda, D. Shiga, H. Kumigashira, R. Higashinaka, T. D. Matsuda, Y. Aoki, M. Hedo, Y. Ōnuki, N. L. Saini, T. Mizokawa
• Resistive control of b-axis oriented VO2 thin film by lithium ions diffusion from LiCoO2 buffer layerR. Kaneko, T. Yamada, R. Morizane, N. Kaneda, R. Tabuchi, G. Notake, D. Shiga, H. Kumigashira, T. Higuchi
• Surface hole–proton mixed conduction of Ti0.99Sc0.01O2−δ thin film with anatase structureT. Yabuki, A. Maekawa, R. Fujita, R. Kunishi, R. Morizane, K. Yamaguchi, D. Shiga, H. Kumigashira, T. Higuchi
• Surface Electron–Ion Mixed Conduction of BaTiO3−δ Thin Film with Oxygen VacanciesT. Takada, T. Fujita, T. Imagawa, E. Yamamoto, J. Kano, D. Shiga, K. Horiba, H. Kumigashira, T. Higuchi

• 強相関酸化物界面設計に基づく電子・結晶構造相転移の独立制御志賀 大亮
• 強相関酸化物素子界面に誘起される集団的電子相転移の機構解明志賀 大亮
• ルチル型相転移酸化物の分光データ駆動界面設計志賀 大亮

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