Tohoku University · Research Institute of Electrical Communication

Research keywordsnoncontact atomic force microscopy・time-delayed feedback・microcantilevers・nonlinear dielectric microscopy・surface dipole imaging・Duffing dynamics・Si(111) surfaces

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• Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric MicroscopyNorimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga, Yasuo Cho
• A Study on Evaluation of Interface Defect Density on High-K/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric MicroscopyKoharu Suzuki, Kohei Yamasue, Yasuo Cho
• Local capacitance-voltage profiling on MoS 2 /SiO 2 and MoS 2 /h-BN/SiO 2 by scanning nonlinear dielectric microscopy assisted with an insulating tipTaiyo Ishizuka, Kohei Yamasue, Yasuo Cho
• Visualization of the local dipole moment at the Si(111) surface using DFT calculationsAkira Sumiyoshi, Kohei Yamasue, Yasuo Cho, Jun Nakamura

• 走査型非線形誘電率顕微鏡に基づくナノスケール自発分極定量測定法の開発2016 · 2016年 ～
• 超高次非線形誘電率顕微鏡法を用いたSiC基板材料及びパワーエレクトロニクス素子の高性能化に資する評価技術の開発2014 · 2014年 ～ 2018年
• 非線形誘電率顕微鏡法を用いた界面電荷輸送現象における諸問題の起源解明長 康雄, 平永 良臣, 山末 耕平
• 走査型非線形誘電率顕微鏡を用いたGaN-MOSの高性能化に資する計測評価長康雄,山末耕平

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