Tohoku University · Cooperative Research Center for Future Science and Technology · 助教

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• Statistical Analysis of Threshold Voltage Variation Using MOSFETs With Asymmetric Source and DrainShinya Ichino, Akinobu Teramoto, Rihito Kuroda, Takezo Mawaki, Tomoyuki Suwa, Shigetoshi Sugawa
• Evaluation of Metal Contamination Behavior on Silicon Wafer Surfaces Rinsed with Deionized Water Containing pg/L-Level ImpuritiesKyohei Tsutano, Takezo Mawaki, Yasuyuki Shirai, Rihito Kuroda
• Analysis of Random Telegraph Noise Behaviers of nMOS and pMOS toward Back Bias Voltage ChangingT. Mawaki, A. Teramoto, R. Kuroda, S. Ichino, S. Sugawa
• 高選択性半導体製造プロセスに向けた 固体表面上の気体分子反応の計測技術と解析に関する研究間脇武蔵

• 次世代メモリの研究を飛躍的に促進する電気的特性の統計的計測プラットフォーム技術間脇 武蔵
• 超省電力・短時間処理・低コストの統計的電気計測による次世代メモリ解析・評価技術間脇 武蔵

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