Toyama Prefectural University · Faculty of Engineering · 講師

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• Extracting BTI-induced Degradation without Temporal Factors by Using BTI-Sensitive and BTI-Insensitive Ring Oscillators
• リングオシレータのランダムテレグラフノイズによる周波数変動自動測定回路
• Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs
• リング型発振器の経年劣化と特性ばらつきの相関の評価

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