University of Tsukuba · Faculty of Pure and Applied Sciences · 教授

Research keywordsscanning electron microscopy・low-vacuum SEM・secondary electron detector・electron source

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• Characterization of ultra-variable-pressure detector for secondary electrons in low-vacuum SEM2025 · 論文
• Acceptance characterization of electron detector in SEM using stainless steel sphere2024 · 論文
• 走査電子顕微鏡用電子源の特性2020 · 論文

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