京都大学 · 工学部・工学研究科

研究キーワードhigh-resolution elastic recoil detection・ion beam analysis・secondary ion mass spectrometry・thin film characterization・hydrogen depth profiling・microelectronics materials

ここは公開データのプレビューです。個別の適合理由、連絡角度、保存機能はログイン後に利用できます。

• Antireflection coatings with FeSi2 layer: Application to spectrally selective infrared emitter2010 · ASIA-PACIFIC CONFERENCE ON SEMICONDUCTING SILICIDES SCIENCE AND TECHNOLOGY TOWARDS SUSTAINABLE OPTOELECTRONICS (APAC-SILICIDE 2010),
• Accumulation of hydrogen near the interface between ultrathin SiO2 and Si(001) under ion irradiation in high-resolution elastic recoil detectionNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
• Bottom-up Process to Fabricate Periodic Arrays of -FeSi2 Nanopillars for Photonic ApplicationsECS Transactions,
• Secondary electron emission from SnTe(001) and KCl(001) surfaces induced by specularly reflected protonsAPPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2,

• 公式プロフィール